BLM meeting
G.Guaglio
4/10
21 Oct 2003
Louvain Results: Components
-
+75 pA
up to -800 pA
+200 pA
SCAN
Cross section effect (beam)
Notes
Integral effect (no beam)
-
-
-
+3% in the last meas.
FIX
-
Ch2 and Ch3 minor changes
Ch2 opposite changes (see)
Ch2 minor changes
Really small increase
+100 pA
-1 nA at 5e8
Up to +700 pA. Recover effect?
FIX
-
-
-
+30 pA
SCAN
MONO
COMP
AMPL
JFET
The most sensible components are the JFET and the amplifier.
There are some crosstalk between the channels, probably through the power alimentation.
Collimation seems to work properly.
With long term measurement we see that ch1 become more sensible to thermal variations (see).